Invention Grant
- Patent Title: Method and a measuring device for investigating signal parameters
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Application No.: US15166627Application Date: 2016-05-27
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Publication No.: US10670631B2Publication Date: 2020-06-02
- Inventor: Luke Cirillo , Andreas Lagler , Clemens Lohmer
- Applicant: Rohde & Schwarz GmbH & Co. KG
- Applicant Address: DE Munich
- Assignee: Rohde & Schwarz GmbH & Co. KG
- Current Assignee: Rohde & Schwarz GmbH & Co. KG
- Current Assignee Address: DE Munich
- Agency: Lee & Hayes, P.C.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@ad02a15
- Main IPC: G01R13/02
- IPC: G01R13/02 ; G01R29/08

Abstract:
The invention relates to a method for investigating signal parameters in an electrical measuring device with a display element with the method steps: display of a detected signal on the display element, manual masking of at least one signal component of the signal by a user by means of a masking element of the measuring device and investigation of signal parameters from the masked signal component or from the unmasked signal component of the signal by the measuring device. At least one further signal parameter is also investigated alongside the time duration and the bandwidth of the masked signal component. According to the invention, a corresponding measuring device is also provided.
Public/Granted literature
- US20170059617A1 Method and a measuring device for investigating signal parameters Public/Granted day:2017-03-02
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