Invention Grant
- Patent Title: Evaluating fairness in devices under test
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Application No.: US16046548Application Date: 2018-07-26
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Publication No.: US10671506B2Publication Date: 2020-06-02
- Inventor: Dean G. Bair , Rebecca M. Gott , Edward J. Kaminski, Jr. , William J. Lewis
- Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Applicant Address: US NY Armonk
- Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee Address: US NY Armonk
- Agency: Heslin Rothenberg Farley & Mesiti P.C.
- Agent William A. Kinnaman, Jr.; Blanche E. Schiller, Esq.
- Main IPC: G06F11/34
- IPC: G06F11/34 ; G06F30/00 ; G06F30/33 ; G01R31/26 ; G06F13/00

Abstract:
Pre-silicon fairness evaluation to detect fairness issues pre-silicon. Drivers drive a plurality of commands on one or more interfaces of a device under test to test the device under test. State associated with the device under test is checked. Based on the state, a determination is made as to whether the drivers are to continue driving commands against the device under test. Based on determining that the drivers are to continue driving the commands, a further determination is made as to whether a predefined limit has been reached. Based on determining the predefined limit has been reached, ending the test of the device under test in which the test fails.
Public/Granted literature
- US20180336114A1 EVALUATING FAIRNESS IN DEVICES UNDER TEST Public/Granted day:2018-11-22
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