Invention Grant
- Patent Title: Performing a test of memory components with fault tolerance
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Application No.: US16209352Application Date: 2018-12-04
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Publication No.: US10672470B1Publication Date: 2020-06-02
- Inventor: Aswin Thiruvengadam , Sivagnanam Parthasarathy , Daniel Scobee
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: MICRON TECHNOLOGY, INC.
- Current Assignee: MICRON TECHNOLOGY, INC.
- Current Assignee Address: US ID Boise
- Agency: Lowenstein Sandler LLP
- Main IPC: G11C29/56
- IPC: G11C29/56 ; G11C13/00 ; G11C29/12

Abstract:
An indication that a test resource of a test platform has failed can be received. The test resource can be associated with performing a portion of a test of memory components. A characteristic of the test resource that failed can be determined. Another test resource of the test platform can be identified based on the characteristic of the test resource that failed. The portion of the test of memory components can be performed based on the another test resource of the test platform.
Public/Granted literature
- US20200176057A1 PERFORMING A TEST OF MEMORY COMPONENTS WITH FAULT TOLERANCE Public/Granted day:2020-06-04
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