Invention Grant
- Patent Title: Hazard based assessment patterns
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Application No.: US15262667Application Date: 2016-09-12
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Publication No.: US10672515B2Publication Date: 2020-06-02
- Inventor: Abhishek Soni , David L. Duke
- Applicant: Roche Diabetes Care, Inc.
- Applicant Address: US IN Indianapolis
- Assignee: Roche Diabetes Care, Inc.
- Current Assignee: Roche Diabetes Care, Inc.
- Current Assignee Address: US IN Indianapolis
- Agency: Dinsmore & Shohl, LLP
- Main IPC: G16H50/20
- IPC: G16H50/20 ; G16H50/30 ; G06K9/62 ; G06N5/04 ; G06F19/00

Abstract:
Methods and devices for retrospectively assessing continuous monitoring reference pattern data to determine a risk of a patient glucose level measurement taken in at least one data segment being outside a predetermined range. The methods and devices can include executing an algorithm to compare risk scores derived from reference pattern data in a currently collected data segment with risk scores of previously stored reference pattern data of previously collected data segments for a patient for assessing risk.
Public/Granted literature
- US20160378937A1 HAZARD BASED ASSESSMENT PATTERNS Public/Granted day:2016-12-29
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