Invention Grant
- Patent Title: Magnetic detection circuit, MRAM and operation method thereof
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Application No.: US15875140Application Date: 2018-01-19
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Publication No.: US10672832B2Publication Date: 2020-06-02
- Inventor: Ji-Feng Ying , Baohua Niu
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee Address: TW Hsinchu
- Agency: McClure, Qualey & Rodack, LLP
- Main IPC: H01L27/22
- IPC: H01L27/22 ; G11C11/16 ; H01F10/14 ; H01F10/16 ; H01F10/32 ; H01L43/08 ; H01L43/12

Abstract:
A magnetic detection circuit for a magnetic random access memory (MRAM) is provided. The magnetic detection circuit includes a sensing array including a plurality of sensing cells and a controller. Each of the sensing cells includes a first magnetic tunnel junction (MTJ) device. The controller is configured to access the first MRAM cells to detect the external magnetic field strength of the MRAM. The controller determines whether to stop the write operation of a plurality of memory cells of the MRAM according to the external magnetic field strength of the MRAM, and each of the memory cells includes a second MTJ device. The first MTJ device is smaller than the second MTJ device.
Public/Granted literature
- US20190140020A1 MAGNETIC DETECTION CIRCUIT, MRAM AND OPERATION METHOD THEREOF Public/Granted day:2019-05-09
Information query
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