Invention Grant
- Patent Title: Apparatus and method for calibrating measuring instruments
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Application No.: US16334944Application Date: 2017-10-17
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Publication No.: US10677652B2Publication Date: 2020-06-09
- Inventor: Samuel Lemieux , Mathieu Manceau , Robert W. Boyd , Gerd Leuchs , Maria V. Chekhova
- Applicant: University of Ottawa , Max-Planck-Gesellschaft zur Forderung der Wissenschaften E.V. , Friedrich-Alexander-Universitaet Erlangen-Nuernberg
- Applicant Address: CA Ottawa DE Munich DE Erlangen
- Assignee: University of Ottawa,Max-Planck-Gesellschaft Zur Forderung Der Wissenschaften E.V.,Friedrich-Alexander-Universitaet Erlangen-Nuernberg
- Current Assignee: University of Ottawa,Max-Planck-Gesellschaft Zur Forderung Der Wissenschaften E.V.,Friedrich-Alexander-Universitaet Erlangen-Nuernberg
- Current Assignee Address: CA Ottawa DE Munich DE Erlangen
- Agency: Miles & Stockbridge P.C.
- Agent Ajay A. Jagtiani
- International Application: PCT/IB2017/056450 WO 20171017
- International Announcement: WO2018/073749 WO 20180426
- Main IPC: G01J3/00
- IPC: G01J3/00 ; G01J3/02 ; G01J3/10 ; G01J3/18 ; G01J3/28 ; G01N21/27 ; G01J3/12

Abstract:
A method and apparatus is provided for implementing a parametric down-conversion (PDC)-based calibration comprising calibrating a measuring instrument; disposing a pinhole at a position of a light-emitting sample for which the measuring instrument needs to be calibrated; irradiating a nonlinear crystal with a light source; setting the nonlinear crystal by ensuring a phase-matching wavelength of the nonlinear crystal is set at one boundary of a desired bandwidth; acquiring one or more PDC spectrums by the measuring instrument; obtaining peak values and their corresponding wavelengths from each acquired spectrum; and obtaining a response function based on the peak values and corresponding wavelengths.
Public/Granted literature
- US20190339126A1 APPARATUS AND METHOD FOR CALIBRATING MEASURING INSTRUMENTS Public/Granted day:2019-11-07
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