Invention Grant
- Patent Title: Measuring device, electronic apparatus, and measuring method
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Application No.: US16052842Application Date: 2018-08-02
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Publication No.: US10677655B2Publication Date: 2020-06-09
- Inventor: Danjun Zhao , Masanobu Kobayashi
- Applicant: Seiko Epson Corporation
- Applicant Address: JP
- Assignee: Seiko Epson Corporation
- Current Assignee: Seiko Epson Corporation
- Current Assignee Address: JP
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@24289bc5
- Main IPC: G01J3/28
- IPC: G01J3/28 ; G01J3/26 ; G01J3/51 ; G01J3/02 ; G01J3/42
Abstract:
A measuring device includes a first light receiving element that receives measurement light and outputs a first output value, and a second light receiving element that receives the measurement light and outputs a second output value which is different from the first output value. A weighted composition is performed on the first output value and the second output value.
Public/Granted literature
- US20180340828A1 MEASURING DEVICE, ELECTRONIC APPARATUS, AND MEASURING METHOD Public/Granted day:2018-11-29
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