Invention Grant
- Patent Title: Scanning infrared measurement system
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Application No.: US16203901Application Date: 2018-11-29
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Publication No.: US10677710B2Publication Date: 2020-06-09
- Inventor: Matthias Wagner
- Applicant: 1087 Systems, Inc.
- Applicant Address: US MA Cambridge
- Assignee: 1087 SYSTEMS, INC.
- Current Assignee: 1087 SYSTEMS, INC.
- Current Assignee Address: US MA Cambridge
- Agency: McAndrews, Held & Malloy, Ltd.
- Main IPC: G01N15/14
- IPC: G01N15/14 ; G01N21/39 ; G01N21/35 ; G01N21/3577 ; G01N21/53 ; G01N15/06 ; G01N15/00 ; G02B21/00 ; G01N21/3581 ; G01N21/552 ; G01N15/10

Abstract:
An analyzer of a component in a sample fluid includes an optical source and an optical detector defining a beam path of a beam, wherein the optical source emits the beam and the optical detector measures the beam after partial absorption by the sample fluid, a fluid flow cell disposed on the beam path defining an interrogation region in the a fluid flow cell in which the optical beam interacts with the sample fluid and a reference fluid; and wherein the sample fluid and the reference fluid are in laminar flow, and a scanning system that scans the beam relative to the laminar flow within the fluid flow cell, wherein the scanning system scans the beam relative to both the sample fluid and the reference fluid.
Public/Granted literature
- US20190187042A1 SCANNING INFRARED MEASUREMENT SYSTEM Public/Granted day:2019-06-20
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