Invention Grant
- Patent Title: Measurement apparatus, system, and method for obtaining conductivity measurements of a surface of a structure
-
Application No.: US15817207Application Date: 2017-11-18
-
Publication No.: US10677746B2Publication Date: 2020-06-09
- Inventor: Mark A. Schmier, II , Gary E. Jones , Ricky A. Kuehn , Heather Burns , Carlos Portugal
- Applicant: The Boeing Company
- Applicant Address: US IL Chicago
- Assignee: The Boeing Company
- Current Assignee: The Boeing Company
- Current Assignee Address: US IL Chicago
- Main IPC: G01N27/20
- IPC: G01N27/20

Abstract:
There is provided a measurement apparatus for obtaining conductivity measurements of a surface of a structure. The apparatus has a housing, and a pair of support legs depending from the housing. Each support leg has a first end, wherein the first ends define a support leg plane. The apparatus has a pair of conductive measurement probes slidably disposed between the support legs, and at least one force applying member coupled to the housing. The at least one force applying member applies a biasing force to cause the pair of conductive measurement probes to extend a predetermined distance beyond the support leg plane. A downward applied force applied to the housing, when the conductive measurement probes are in contact with the surface, causes a displacement of the conductive measurement probes, until the first ends of the support legs contact the surface. Conductivity measurements between the conductive measurement probes are consistently obtained.
Public/Granted literature
Information query