Invention Grant
- Patent Title: Sensor calibration device and sensor calibration method
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Application No.: US15914020Application Date: 2018-03-07
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Publication No.: US10677751B2Publication Date: 2020-06-09
- Inventor: Masahide Yoshikawa , Tomoaki Eto , Shouji Igarashi , Yuichi Nozaka
- Applicant: Yokogawa Electric Corporation
- Applicant Address: JP Musashino-shi, Tokyo
- Assignee: Yokogawa Electric Corporation
- Current Assignee: Yokogawa Electric Corporation
- Current Assignee Address: JP Musashino-shi, Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@31e8df42
- Main IPC: G01N27/416
- IPC: G01N27/416 ; G01N33/00

Abstract:
A sensor calibration device for calibrating a sensor device, includes a sensor reader configured to read, from a reference sensor, a physical quantity which is a reference of a calibration and detected by the reference sensor, and a sensor manager configured to convert the physical quantity read by the sensor reader into a reference measurement value, the sensor manager being configured to obtain a calibration target measurement value obtained by the sensor device measuring the physical quantity, and the sensor manager being configured to output, to the sensor device, a calibration instruction based on the reference measurement value and the calibration target measurement value.
Public/Granted literature
- US20180259479A1 SENSOR CALIBRATION DEVICE AND SENSOR CALIBRATION METHOD Public/Granted day:2018-09-13
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