Invention Grant
- Patent Title: System for testing an integrated circuit of a device and its method of use
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Application No.: US14973506Application Date: 2015-12-17
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Publication No.: US10677843B2Publication Date: 2020-06-09
- Inventor: Scott E. Lindsey , Jovan Jovanovic , David S. Hendrickson , Donald P. Richmond, II
- Applicant: Aehr Test Systems
- Applicant Address: US CA Fremont
- Assignee: AEHR TEST SYSTEMS
- Current Assignee: AEHR TEST SYSTEMS
- Current Assignee Address: US CA Fremont
- Agent Stephen M. De Klerk
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R31/319
Abstract:
A cartridge, including a cartridge frame, formations on the cartridge frame for mounting the cartridge frame in a fixed position to an apparatus frame, a contactor support structure, a contactor interface on the contactor support structure, a plurality of terminals, held by the contactor support structure, for contacting contacts on a device, and a plurality of conductors, held by the contactor support structure, connecting the interface to the terminals.
Public/Granted literature
- US20160103179A1 SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD OF USE Public/Granted day:2016-04-14
Information query
