- Patent Title: System and method of acquiring images using an X-ray imaging system
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Application No.: US14927244Application Date: 2015-10-29
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Publication No.: US10677939B2Publication Date: 2020-06-09
- Inventor: Biju Jacob , Hao Lai , Remy Andre Klausz , John Eric Tkaczyk
- Applicant: GENERAL ELECTRIC COMPANY
- Applicant Address: US NY Schenectady
- Assignee: GENERAL ELECTRIC COMPANY
- Current Assignee: GENERAL ELECTRIC COMPANY
- Current Assignee Address: US NY Schenectady
- Agency: Fletcher Yoder, P.C.
- Main IPC: G01T1/20
- IPC: G01T1/20 ; H04N5/32 ; H04N5/361 ; H04N5/365 ; H04N5/355 ; G01T1/24

Abstract:
Improvement of the dynamic range of a radiation detector is described. In one embodiment, one or more non-destructive readout operations are performed during a radiation exposure event to acquire data used to improve the dynamic range of the detector. In one implementation, one or more non-destructive readouts of pixels are performed prior to saturation of the pixels during an X-ray exposure so as to obtain non-saturated measurements at the pixels. In an additional implementation, non-destructive readouts of pixels are performed between exposure events so as to obtain an estimate of electronic noise during a multi-exposure examination.
Public/Granted literature
- US20170123079A1 SYSTEM AND METHOD OF ACQUIRING IMAGES USING AN X-RAY IMAGING SYSTEM Public/Granted day:2017-05-04
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