Invention Grant
- Patent Title: Inspecting apparatus
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Application No.: US15680272Application Date: 2017-08-18
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Publication No.: US10678385B2Publication Date: 2020-06-09
- Inventor: Koji Sakamoto , Toshihide Matsukawa , Koji Iwami , Shigeki Fujita , Osamu Hikita
- Applicant: NIDEC-READ CORPORATION
- Applicant Address: JP Kyoto
- Assignee: NIDEC-READ CORPORATION
- Current Assignee: NIDEC-READ CORPORATION
- Current Assignee Address: JP Kyoto
- Agency: Viering, Jentschura & Partner MBB
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@2d7f9d3f
- Main IPC: G06F3/044
- IPC: G06F3/044 ; G06F11/22 ; G06F3/0354 ; G06F3/041

Abstract:
An inspection apparatus is provided with a holder configured to set an inspection target thereon, the inspection target configured to detect a contact position on the inspection target touched by a human finger; pseudo finger(s) configured to be detected as the human finger upon contact with the inspection target; a positioner configured to move the pseudo finger(s) relative to the inspection target and to change the contact position of the pseudo finger(s) relative to the inspection target; a memory configured to store, respectively, a value of a pressing force in a range of pressing forces said range including a zero pressing force for each of the pseudo finger(s) on the inspection target; a controller configured to regulate the pressing force for pseudo finger(s) of the pseudo finger(s) based on the respective value; and a sensor configured to acquire an electric signal output from the inspection target.
Public/Granted literature
- US20170344159A1 INSPECTING APPARATUS Public/Granted day:2017-11-30
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