Invention Grant
- Patent Title: Software program fault localization
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Application No.: US15648441Application Date: 2017-07-12
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Publication No.: US10678673B2Publication Date: 2020-06-09
- Inventor: Ripon K. Saha , Mukul R. Prasad
- Applicant: FUJITSU LIMITED
- Applicant Address: JP Kawasaki
- Assignee: FUJITSU LIMITED
- Current Assignee: FUJITSU LIMITED
- Current Assignee Address: JP Kawasaki
- Agency: Maschoff Brennan
- Main IPC: G06F11/36
- IPC: G06F11/36 ; G06F11/07

Abstract:
According to an aspect of an embodiment, a method may include executing multiple tests with respect to code under test of a software program to perform multiple test executions. The method may further include identifying one or more passing tests and one or more failing tests of the test executions. In addition, the method may include determining an aggregated score for each statement based on two or more of: the passing tests and the failing tests; a semantic similarity between one or more statement tokens included in the respective statement and one or more report tokens included in an error report; and an amount of time that has passed from when the respective statement received a change. Moreover, the method may include identifying a particular statement of the plurality of statements as a fault location in the code under test based on the aggregated scores of the plurality of statements.
Public/Granted literature
- US20190018753A1 SOFTWARE PROGRAM FAULT LOCALIZATION Public/Granted day:2019-01-17
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