- Patent Title: Method to determine support costs associated with specific defects
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Application No.: US15282756Application Date: 2016-09-30
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Publication No.: US10679295B1Publication Date: 2020-06-09
- Inventor: Mark Opperman , Ryan Montgomery , Eric Schnegelberger
- Applicant: EMC IP Holding Company LLC
- Applicant Address: US MA Hopkinton
- Assignee: EMC IP HOLDING COMPANY LLC
- Current Assignee: EMC IP HOLDING COMPANY LLC
- Current Assignee Address: US MA Hopkinton
- Agency: Womble Bond Dickinson (US) LLP
- Main IPC: G06Q10/10
- IPC: G06Q10/10 ; G06Q40/08 ; G06F16/242

Abstract:
Case analysis is provided in which costs are associated with case information such as service request data. A description of defect classifications may be defined using keywords and attributes. A database query is generated based on the description of defect classifications to classify case information by problem type to a domain and a component. The description of defect classifications may be applied to a result of the database query to perform problem classification analysis. A cost analysis may be performed by problem group based at least on the case information associated with cost information and the result of the database SQL query.
Information query