Invention Grant
- Patent Title: Electronic component handler and electronic component tester
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Application No.: US16048967Application Date: 2018-07-30
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Publication No.: US10679335B2Publication Date: 2020-06-09
- Inventor: Hirokazu Ishida , Yuya Kimura , Tatsunori Takahashi
- Applicant: Seiko Epson Corporation
- Applicant Address: JP
- Assignee: Seiko Epson Corporation
- Current Assignee: Seiko Epson Corporation
- Current Assignee Address: JP
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@3aec179b
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G01R31/28

Abstract:
An electronic component handler includes a region where an electronic component placement unit on which an electronic component is placed is capable of being disposed. A laser light source emits light toward the electronic component placement unit placed in the region. A capturing unit is capable of capturing an image of the electronic component and irradiated with the light. A processor determines the presence or absence of the electronic component in the electronic component placement unit based on the image. In the image, the processor sets a first candidate region and a second candidate region from an electronic component placement region which is a region where the electronic component is placed, determines a selected region by comparing the first candidate region and the second candidate region to each other, and performs the determination based on the selected region.
Public/Granted literature
- US20190035074A1 ELECTRONIC COMPONENT HANDLER AND ELECTRONIC COMPONENT TESTER Public/Granted day:2019-01-31
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