Invention Grant
- Patent Title: Method and apparatus for semiconductor processing chamber isolation for reduced particles and improved uniformity
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Application No.: US15866506Application Date: 2018-01-10
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Publication No.: US10679827B2Publication Date: 2020-06-09
- Inventor: Gopu Krishna , Ravikumar Patil , Hanish Kumar Panavalappil Kumarankutty , Somil Kapadia , Sonny Kunnakkat
- Applicant: Applied Materials, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: APPLIED MATERIALS, INC.
- Current Assignee: APPLIED MATERIALS, INC.
- Current Assignee Address: US CA Santa Clara
- Agency: Patterson + Sheridan, LLP
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@e156528
- Main IPC: H01J37/32
- IPC: H01J37/32 ; C23C16/50 ; C23C16/458 ; C23C16/44 ; H01L21/02 ; H01L21/285

Abstract:
Implementations of the present disclosure generally relate to apparatus and methods for uniform deposition of thin films on substrates. In one implementation, a plasma-processing chamber comprises a chamber body including chamber walls, a chamber floor, and a lid support. The plasma-processing chamber further comprises a substrate support assembly at least partially disposed within the chamber body and configured to support a substrate. The plasma-processing chamber further comprises a lid assembly disposed over the support assembly and positioned on the lid support wherein the lid assembly and the chamber body define a first processing volume. The plasma-processing chamber further comprises a bottom isolation assembly that circumscribes at least a portion of the substrate support assembly and is vertically movable from a loading position to a processing position. A seal is formed between the bottom isolation assembly and the lid assembly when the bottom isolation assembly is in the processing position.
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