Invention Grant
- Patent Title: Wafer bonding method and structure thereof
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Application No.: US16046172Application Date: 2018-07-26
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Publication No.: US10679854B2Publication Date: 2020-06-09
- Inventor: Shuai Guo , Jia Wen Wang , Tao Tao Ding , Rui Yuan Xing , Xiao Jin Wang , Jia You Wang , Chun Long Li
- Applicant: Yangtze Memory Technologies Co., Ltd.
- Applicant Address: CN Wuhan, Hubei
- Assignee: Yangtze Memory Technologies Co., Ltd.
- Current Assignee: Yangtze Memory Technologies Co., Ltd.
- Current Assignee Address: CN Wuhan, Hubei
- Agency: Sterne, Kessler, Goldstein & Fox P.L.L.C.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@3cf000df
- Main IPC: H01L21/18
- IPC: H01L21/18 ; H01L21/20 ; H01L21/762 ; H01L21/02 ; H01L21/26 ; H01L21/324

Abstract:
Embodiments of wafer bonding method and structures thereof are disclosed. The wafer bonding method can include performing a plasma activation treatment on a front surface of a first and a front surface of a second wafer; performing a silica sol treatment on the front surfaces of the first and the second wafers; performing a preliminary bonding process of the first and second wafer; and performing a heat treatment of the first and the second wafers to bond the front surface of the first wafer to the front surface of the second wafers.
Public/Granted literature
- US20190051524A1 WAFER BONDING METHOD AND STRUCTURE THEREOF Public/Granted day:2019-02-14
Information query
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