- Patent Title: Semiconductor device, test method, and system including the same
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Application No.: US15696865Application Date: 2017-09-06
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Publication No.: US10679913B2Publication Date: 2020-06-09
- Inventor: Sang Ah Hyun , Seok Bo Shim , Sang Ho Lee
- Applicant: SK hynix Inc.
- Applicant Address: KR Icheon-si, Gyeonggi-do
- Assignee: SK hynix Inc.
- Current Assignee: SK hynix Inc.
- Current Assignee Address: KR Icheon-si, Gyeonggi-do
- Agency: William Park & Associates Ltd.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@5e54bed2
- Main IPC: G01R31/02
- IPC: G01R31/02 ; H01L21/66 ; G11C29/12 ; G11C29/18 ; G01R31/28 ; G11C29/02 ; G11C29/50 ; G01R31/50 ; G11C29/04 ; H01L25/065
Abstract:
A semiconductor device, a test method, and a system including the same are disclosed, which may relate to a technology for testing open and short states of a pad of a semiconductor device.
Public/Granted literature
- US20180342430A1 SEMICONDUCTOR DEVICE, TEST METHOD, AND SYSTEM INCLUDING THE SAME Public/Granted day:2018-11-29
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