Invention Grant
- Patent Title: Power metal-oxide-semiconductor field-effect transistor
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Application No.: US15665007Application Date: 2017-07-31
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Publication No.: US10680101B2Publication Date: 2020-06-09
- Inventor: Wan-Jyun Syue , Chin-Yi Huang , Kuo-Lung Tzeng , Zhuo-Cang Yang
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Duane Morris LLP
- Main IPC: H01L29/78
- IPC: H01L29/78 ; H01L29/08 ; H01L29/423 ; H01L29/417 ; H01L29/06 ; H01L29/10 ; H01L29/66 ; H01L21/762

Abstract:
A semiconductor device includes: a first semiconductor region disposed over a second semiconductor region, wherein the first and second semiconductor regions have a first doping type and a second doping type, respectively; a first source/drain contact region and a second source/drain contact region having the second doping type and laterally spaced; and a gate electrode disposed laterally between the first and second source/drain contact regions, wherein the gate electrode comprises a first sidewall relatively closer to the first source/drain region and a second sidewall relatively closer to the second source/drain region, and wherein respective cross-sectional areas of the first and second sidewalls of the gate electrode are different from each other.
Public/Granted literature
- US20190035929A1 NOVEL POWER METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTOR Public/Granted day:2019-01-31
Information query
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