- Patent Title: Methods and apparatuses for testing inductive coupling circuitry
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Application No.: US15692594Application Date: 2017-08-31
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Publication No.: US10680572B2Publication Date: 2020-06-09
- Inventor: Gernot Hueber , Leonhard Kormann , Ian Thomas Macnamara
- Applicant: NXP B.V.
- Applicant Address: NL Eindhoven
- Assignee: NXP B.V.
- Current Assignee: NXP B.V.
- Current Assignee Address: NL Eindhoven
- Main IPC: H03H7/38
- IPC: H03H7/38 ; H03H7/01 ; H04L25/49 ; G01R27/02 ; H04L25/02 ; H03H11/12 ; H03H7/46

Abstract:
Aspects of the disclosure are directed to auto-sweeping impedance-matching circuitry that matches an impedance of an RF antenna. As may be implemented in accordance with one or more embodiments, a transmitter that is configured and arranged to transmit signals to remote devices via the RF antenna, is used to communicate a plurality of test signals to the impedance-matching circuitry, with each test signal having a designated frequency and/or test signal pattern that is different than the designated frequency and/or test signal pattern of the other test signals. A characteristic of each of the test signals as passed through the impedance-matching circuitry is detected. For each of the test signals generated for the auto-sweep, the detected characteristic is compared to an expected characteristic for the test signal, and an output indicative of compliance of the impedance-matching circuitry with a design specification is generated and transmitted in response to the comparison.
Public/Granted literature
- US20190068156A1 METHODS AND APPARATUSES FOR TESTING INDUCTIVE COUPLING CIRCUITRY Public/Granted day:2019-02-28
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