Invention Grant
- Patent Title: Beam management techniques for beam calibration
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Application No.: US15839382Application Date: 2017-12-12
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Publication No.: US10680689B2Publication Date: 2020-06-09
- Inventor: Pengfei Xia , Bin Liu
- Applicant: Futurewei Technologies, Inc.
- Applicant Address: US TX Plano
- Assignee: Futurewei Technologies, Inc.
- Current Assignee: Futurewei Technologies, Inc.
- Current Assignee Address: US TX Plano
- Agency: Slater Matsil, LLP
- Main IPC: H04B7/06
- IPC: H04B7/06 ; H04L5/00 ; H04W72/04 ; H04W16/28 ; H04B7/08 ; H04B17/318 ; H04B17/12

Abstract:
Embodiments of this disclosure provide techniques for determining a device's beam correspondence status. As used herein, a device is considered to have “beam correspondence” when the device's TX and RX antennas satisfy a calibration criteria. In one example, a device's TX and RX antennas satisfy the calibration criteria when a difference between quality parameters corresponding to reference signals transmitted and received using corresponding TX and RX beams is less than a threshold. In another example, a device's TX and RX antennas satisfy the calibration criteria when a list of indices ranking the device's TX beams matches a list of indices ranking the device's RX beams. The lists of indices may be derived by transmitting and receiving references signals according to the devices RX and TX beams, and then generating list of indices based on quality parameters of the respective RX and TX beams.
Public/Granted literature
- US20180191418A1 Beam Management Techniques for Beam Calibration Public/Granted day:2018-07-05
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