Invention Grant
- Patent Title: Single-slope comparison device with low-noise, and analog-to-digital conversion device and CMOS image sensor including the same
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Application No.: US16154492Application Date: 2018-10-08
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Publication No.: US10681297B2Publication Date: 2020-06-09
- Inventor: Hyeon-June Kim , Min-Kyu Kim
- Applicant: SK hynix Inc.
- Applicant Address: KR Icheon-si
- Assignee: SK hynix Inc.
- Current Assignee: SK hynix Inc.
- Current Assignee Address: KR Icheon-si
- Agency: Perkins Coie LLP
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@27b98d3d
- Main IPC: H04N5/378
- IPC: H04N5/378 ; H04N5/374 ; H04N9/04 ; H04N5/3745

Abstract:
A comparison device includes an offset generation circuit that includes an input port to receive an offset control signal and is structured to generate an offset based on the received offset control signal; a comparison circuit comprising a first input port coupled to the offset generation circuit to receive a first input signal and a second input port coupled to receive a second input signal that is offset by the offset generated by the offset generation circuit and operable to compare the first input signal with the second input signal to produce a comparison signal; and a control circuit coupled to the comparison circuit to receive the comparison signal and operable to detect a crossing of the first input signal and the second input signal according to the comparison signal circuit and to output the offset control signal to the offset generation circuit.
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