Invention Grant
- Patent Title: Camera-assisted arbitrary surface characterization and slope-based correction
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Application No.: US16200614Application Date: 2018-11-26
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Publication No.: US10681318B2Publication Date: 2020-06-09
- Inventor: Jaime Rene De La Cruz , Jeffrey Mathew Kempf
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent Michelle F. Murray; Charles A. Brill; Frank D. Cimino
- Main IPC: H04N9/00
- IPC: H04N9/00 ; G06T7/70 ; G06T7/521 ; H04N9/31 ; G06T5/00

Abstract:
In described examples, structured light elements are projected for display on a projection screen surface. The projected light elements are captured for determining a three-dimensional characterization of the projection screen surface. A three-dimensional characterization of the projection screen surface is generated in response to the displayed structured light elements. An observer perspective characterization of the projection screen surface is generated in response to an observer position and the three-dimensional characterization. A depth for at least one point of the observer perspective characterization is determined in response to depth information of respective neighboring points of the at least one point of the observer perspective characterization. A compensated image can be projected on the projection screen surface in response to the observer perspective characterization and depth information of respective neighboring points of the at least one point of the observer perspective characterization.
Public/Granted literature
- US20190166339A1 CAMERA-ASSISTED ARBITRARY SURFACE CHARACTERIZATION AND SLOPE-BASED CORRECTION Public/Granted day:2019-05-30
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