Invention Grant
- Patent Title: Wafer-level manufacture of devices, in particular of optical devices
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Application No.: US15310838Application Date: 2015-05-14
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Publication No.: US10682824B2Publication Date: 2020-06-16
- Inventor: Alexander Bietsch , Michel Barge
- Applicant: ams Sensors Singapore Pte. Ltd.
- Applicant Address: SG Singapore
- Assignee: ams Sensors Singapore Pte. Ltd.
- Current Assignee: ams Sensors Singapore Pte. Ltd.
- Current Assignee Address: SG Singapore
- Agency: Michael Best and Friedrich LLP
- International Application: PCT/SG2015/050113 WO 20150514
- International Announcement: WO2015/174930 WO 20151119
- Main IPC: B29D11/00
- IPC: B29D11/00 ; B32B41/00 ; H01L23/24 ; H01L21/54 ; B32B37/12 ; B05D3/12 ; B29C59/02 ; B29C59/16 ; B29C65/48 ; G02B13/00 ; G03F7/20 ; B32B38/00 ; B29L31/34 ; B29L31/00

Abstract:
The wafer-level method for applying N≥2 first elements to a first side of a substrate, wherein the substrate has at the first side a first surface including the steps of providing the substrate, wherein at least N barrier members are present at the first side, and wherein each barrier member is associated with one of the first elements. For each of the first elements, the method includes bringing a first amount of a hardenable material in a flowable state in contact with the first surface, the first amount of hardenable material being associated with the first element; controlling a flow of the first amount of hardenable material on the first surface with the associated barrier member; and hardening the first amount of hardenable material to interconnect the first surface and the respective element.
Public/Granted literature
- US20170087784A1 WAFER-LEVEL MANUFACTURE OF DEVICES, IN PARTICULAR OF OPTICAL DEVICES Public/Granted day:2017-03-30
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