Invention Grant
- Patent Title: Method and scanning fluorescence microscope for multi-dimensional high-resolution imaging a structure or a path of a particle in a sample
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Application No.: US15722111Application Date: 2017-10-02
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Publication No.: US10684225B2Publication Date: 2020-06-16
- Inventor: Alexander Egner , Claudia Geisler , Jennifer-Rose Krueger
- Applicant: Laser-Laboratorium Goettingen e.V.
- Applicant Address: DE Goettingen
- Assignee: LASER-LABORATORIUM GOETTINGEN E.V
- Current Assignee: LASER-LABORATORIUM GOETTINGEN E.V
- Current Assignee Address: DE Goettingen
- Agency: Thomas | Horstemeyer, LLP
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@20793c8c
- Main IPC: G01N21/64
- IPC: G01N21/64 ; G02B21/00 ; G02B27/58 ; G02B21/16

Abstract:
For multi-dimensional high-resolution imaging a structure marked with fluorescence markers, fluorescence enabling light is focused to illuminate a measurement area in a sample. A partial area of the measurement area is subjected to fluorescence inhibiting light. The partial area omits a center of the measurement area in that an intensity distribution of the fluorescence inhibiting light comprises a line-shaped intensity minimum. A minimal extension of the intensity minimum in a direction through the center area is by a factor k≥2 smaller than a diameter of the measurement area in said direction. Without spatial resolution, fluorescence light emitted out of the measurement area is measured for a plurality of consecutive angle positions of the intensity minimum about the center, while the measurement area, for each angle position, is subjected to the fluorescence enabling light. A value of the measured fluorescence light is assigned to the position of the center.
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