Invention Grant
- Patent Title: Jitter monitoring circuit
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Application No.: US16203338Application Date: 2018-11-28
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Publication No.: US10684325B2Publication Date: 2020-06-16
- Inventor: Tien-Chien Huang
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Duane Morris LLP
- Main IPC: G01R31/317
- IPC: G01R31/317

Abstract:
A circuit includes: a first delay circuit configured to receive a first clock signal; a second delay circuit configured to receive a second clock signal; a delay control circuit, coupled to the first and second delay circuits, and configured to cause the first and second delay circuits to respectively align the first and second clock signals within a noise window; and a loop control circuit, coupled to the first and second delay circuits, and configured to alternately form a first oscillation loop and a second oscillation loop passing through each of the first and second delay circuits so as to determine the noise window.
Public/Granted literature
- US20190162783A1 NOVEL JITTER MONITORING CIRUCIT Public/Granted day:2019-05-30
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