- Patent Title: Camera-assisted arbitrary surface characterization and correction
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Application No.: US15813146Application Date: 2017-11-14
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Publication No.: US10684537B2Publication Date: 2020-06-16
- Inventor: Jaime Rene De La Cruz , Jeffrey Mathew Kempf
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent Michelle F. Murray; Charles A. Brill; Frank D. Cimino
- Main IPC: G03B21/00
- IPC: G03B21/00 ; G06T5/00 ; G03B21/14

Abstract:
In described examples, a geometric progression of structured light elements is iteratively projected for display on a projection screen surface. The displayed progression is for determining a three-dimensional characterization of the projection screen surface. Points of the three-dimensional characterization of a projection screen surface are respaced in accordance with a spacing grid and an indication of an observer position. A compensated depth for each of the respaced points is determined in response to the three-dimensional characterization of the projection screen surface. A compensated image can be projected on the projection screen surface in response to the respaced points and respective compensated depths.
Public/Granted literature
- US20190146313A1 CAMERA-ASSISTED ARBITRARY SURFACE CHARACTERIZATION AND CORRECTION Public/Granted day:2019-05-16
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