Invention Grant
- Patent Title: Abnormality detection apparatus and machine learning device
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Application No.: US16105333Application Date: 2018-08-20
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Publication No.: US10684608B2Publication Date: 2020-06-16
- Inventor: Shinichi Tanaka
- Applicant: FANUC Corporation
- Applicant Address: JP Yamanashi
- Assignee: FANUC CORPORATION
- Current Assignee: FANUC CORPORATION
- Current Assignee Address: JP Yamanashi
- Agency: Hauptman Ham, LLP
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@23d21e97
- Main IPC: G05B19/00
- IPC: G05B19/00 ; G05B19/4065

Abstract:
An abnormality detection apparatus includes: a state observation section that observes tool weight data on weights of tools attached to a tool exchange device, tool balance data on balances of the tools, and tool exchange state data on a state during exchange of the tools; a tool exchange state data storage section that stores the tool weight data, the tool balance data, and the tool exchange state data in association with each other; and a determination result output section that detects an abnormality in the exchange of the tools based on the tool weight data, the tool balance data, and the tool exchange state data observed by the state observation section during the exchange of the tools in the processing machine and the data stored in the tool exchange state data storage section.
Public/Granted literature
- US10649436B2 Abnormality detection apparatus and machine learning device Public/Granted day:2020-05-12
Information query
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