Invention Grant
- Patent Title: Method and system for avoiding collision between inspection devices during inspection of an area
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Application No.: US16370826Application Date: 2019-03-29
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Publication No.: US10685575B1Publication Date: 2020-06-16
- Inventor: Nikhil Pareek , Vinod Pathangay
- Applicant: Wipro Limited
- Applicant Address: IN Bangalore
- Assignee: Wipro Limited
- Current Assignee: Wipro Limited
- Current Assignee Address: IN Bangalore
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner, LLP
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@eb2a258
- Main IPC: G08G9/02
- IPC: G08G9/02 ; G06T7/00 ; G06T7/70 ; H04N5/225

Abstract:
Disclosed herein are methods and collision avoidance systems and devices for avoiding collision between inspection devices during inspection of an area. In an embodiment, spatial information of the area, dynamically received from each inspection device, is used for creating current local map for each inspection device. Subsequently, a global map of area is generated using local maps and each inspection device is localized within the global map for identifying current location of the inspection devices. Thereafter, sub-paths for navigating each inspection device are estimated based on global map and current location of the inspection devices, validated for collision avoidance and provided to corresponding inspection devices. The inspection devices navigate across the area using the sub-paths and complete inspection of the area. In some embodiments, the present disclosure helps in faster and accurate inspection of the area by inspecting the area using concurrently operated inspection devices.
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