Invention Grant
- Patent Title: Monocrystalline silicon sputtering target
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Application No.: US15889278Application Date: 2018-02-06
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Publication No.: US10685820B2Publication Date: 2020-06-16
- Inventor: Hiroshi Takamura , Ryosuke Sakashita , Shuhei Murata
- Applicant: JX Nippon Mining & Metals Corporation
- Applicant Address: JP Tokyo
- Assignee: JX NIPPON MINING & METALS CORPORATION
- Current Assignee: JX NIPPON MINING & METALS CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Howson & Howson LLP
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@674f6987
- Main IPC: H01J37/34
- IPC: H01J37/34 ; C23C14/14 ; C23C14/34

Abstract:
A sputtering target formed from monocrystalline silicon is provided, wherein a sputter surface of the sputtering target is a plane inclined at an angle that exceeds 1° and is less than 10° from a {100} plane. The sputtering target formed from monocrystalline silicon provides a sputtering target which yields superior mechanical strength as well as exhibiting a sputter performance which is equivalent to that of a {100} plane. From a different perspective, in addition to superior mechanical strength, the monocrystalline silicon sputtering target yields superior particle characteristics, sputtering rate, crack resistance, surface shape uniformity and other characteristics.
Public/Granted literature
- US20180226236A1 MONOCRYSTALLINE SILICON SPUTTERING TARGET Public/Granted day:2018-08-09
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