Invention Grant
- Patent Title: Process variation as die level traceability
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Application No.: US16114674Application Date: 2018-08-28
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Publication No.: US10685918B2Publication Date: 2020-06-16
- Inventor: Jan Lucie Axel Lettens , Wim Dobbelaere , Bart Arthur Norbert De Leersnyder , Thomas Van Vossel
- Applicant: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Applicant Address: US AZ Phoenix
- Assignee: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Current Assignee: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Current Assignee Address: US AZ Phoenix
- Agency: Wash Park IP Ltd.
- Agent John T. Kennedy
- Main IPC: H01L29/66
- IPC: H01L29/66 ; H01L21/66 ; H01L23/544 ; H01L27/08 ; H01L29/866

Abstract:
Devices, systems and methods for uniquely identifying integrated circuits are provided. For at least one embodiment, a method for marking a given integrated circuit out of a plurality of integrated circuits, includes the operations of fabricating a plurality of identifier devices onto each integrated circuit of the plurality of integrated circuits; testing each of the plurality of identifier devices to obtain a test result for each identifier device; associating together each test result obtained for each identifier device fabricated onto each given integrated circuit to form an analog identifier for the given integrated circuit; and storing in a database each analog identifier for each of the plurality of integrated circuits. For at least one embodiment, a method for identifying an integrated circuit previously marked in an accordance with the present disclosure is provided. Articles of commerce marked using an embodiment of the present disclosure are also described.
Public/Granted literature
- US20200075499A1 PROCESS VARIATION AS DIE LEVEL TRACEABILITY Public/Granted day:2020-03-05
Information query
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