Invention Grant
- Patent Title: Surface plasmon-enhanced fluorescence measurement device and surface plasmon-enhanced fluorescence measurement method
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Application No.: US15536109Application Date: 2015-12-01
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Publication No.: US10690596B2Publication Date: 2020-06-23
- Inventor: Yukito Nakamura , Kosuke Nagae , Takatoshi Kaya
- Applicant: Konica Minolta, Inc.
- Applicant Address: JP Tokyo
- Assignee: Konica Minolta, Inc.
- Current Assignee: Konica Minolta, Inc.
- Current Assignee Address: JP Tokyo
- Agency: BakerHostetler
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@531b3ff6
- International Application: PCT/JP2015/083763 WO 20151201
- International Announcement: WO2016/098581 WO 20160623
- Main IPC: G01N33/553
- IPC: G01N33/553 ; G01N21/64 ; G01J3/02 ; G01J3/18 ; G01N33/543

Abstract:
The surface plasmon-enhanced fluorescence measurement device has: a light source that irradiates the diffraction grating with a linearly polarized excitation light; a rotating part that changes the direction of the optical axis of the excitation light with respect to the diffraction grating when seen in plan view, or changes the polarization direction of the excitation light with respect to the diffraction grating; a polarizer that extracts linearly polarized light from the fluorescence emitted from the fluorescent substance; and a light detection unit that detects the linearly polarized light extracted by the polarizer.
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