Invention Grant
- Patent Title: Air pipe joint and measurement system for substrate inspection
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Application No.: US15752549Application Date: 2018-01-24
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Publication No.: US10690598B2Publication Date: 2020-06-23
- Inventor: Kai Shi
- Applicant: Wuhan China Star Optoelectronics Technology Co., Ltd.
- Applicant Address: CN Wuhan
- Assignee: WUHAN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Current Assignee: WUHAN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Current Assignee Address: CN Wuhan
- Agency: Hemisphere Law, PLLC
- Agent Zhigang Ma
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@2370498d
- International Application: PCT/CN2018/074066 WO 20180124
- International Announcement: WO2019/127798 WO 20190704
- Main IPC: G01B11/02
- IPC: G01B11/02 ; G01N21/88 ; G01N21/958 ; G01N21/95

Abstract:
This invention discloses an air pipe joint for inspecting a substrate, including a hollow pipe body and a light source. The pipe body comprises a first pipe body and a second pipe body which are bent to and communicated with each other. Free ends of the first pipe body and the second pipe body are respectively an air inlet end for connecting an air intake pipe and an air outlet end for discharging air. The light source is fixed inside the pipe body. The light emitted by the light source is emitted from the air outlet end. This invention further discloses a measurement system for substrate inspection. The air pipe joint can emit light from the air outlet end thereof, reduce a blind spot on the transparent stage and influence on measurement accuracy due to a blocking of the air pipe joint itself against the light source.
Public/Granted literature
- US20190383752A1 AIR PIPE JOINT AND MEASUREMENT SYSTEM FOR SUBSTRATE INSPECTION Public/Granted day:2019-12-19
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