A signal distribution apparatus for distributing a stress signal to a plurality of devices under test (DUTs) is disclosed. The distribution apparatus includes a single input that receives the stress voltage signal to be distributed, a plurality of outputs that distribute the stress voltage signal to the plurality of DUTs, and a plurality of integrated current limiter and switch circuits. Each integrated current limiter and switch circuit connects a DUT of the plurality of DUTs to the single input through one of the plurality of outputs, and includes at least one combined switching and current limiting element.