Invention Grant
- Patent Title: Magnetic field measuring method and magnetic field measuring apparatus
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Application No.: US15766238Application Date: 2016-08-22
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Publication No.: US10690732B2Publication Date: 2020-06-23
- Inventor: Tetsuya Matsuda , Kazuo Yamamoto
- Applicant: Mitsubishi Electric Corporation
- Applicant Address: JP Chiyoda-ku
- Assignee: Mitsubishi Electric Corporation
- Current Assignee: Mitsubishi Electric Corporation
- Current Assignee Address: JP Chiyoda-ku
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@516de4ec
- International Application: PCT/JP2016/074333 WO 20160822
- International Announcement: WO2017/098753 WO 20170615
- Main IPC: G01R33/02
- IPC: G01R33/02 ; H01F7/20 ; G01B7/00 ; G01B7/305 ; G01R33/07 ; H05H7/04

Abstract:
A magnetic field measuring method includes: a first radial-magnetic-field measuring using a magnetic field measuring element placed at an offset position apart from the coil axis, to thereby measure, at the offset position, first radial magnetic fields along an offset axis parallel to the coil axis; a second radial-magnetic-field measuring using the magnetic field measuring element after being rotated by a set angle, to thereby measure, at the offset position, second radial magnetic fields along the offset axis; and a center-position determining the inter-coil center position, based on a first radial-magnetic-field characteristic that is a characteristic in a direction of the offset axis of the first radial magnetic fields, and a second radial-magnetic-field characteristic that is a characteristic in the direction of the offset axis of the second radial magnetic fields.
Public/Granted literature
- US20180284198A1 MAGNETIC FIELD MEASURING METHOD AND MAGNETIC FIELD MEASURING APPARATUS Public/Granted day:2018-10-04
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