Invention Grant
- Patent Title: Flash memory error correction method and apparatus
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Application No.: US15965424Application Date: 2018-04-27
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Publication No.: US10691535B2Publication Date: 2020-06-23
- Inventor: Yanxing Zeng , Jianqiang Shen , Gongyi Wang
- Applicant: Huawei Technologies Co., Ltd.
- Applicant Address: CN Shenzhen
- Assignee: HUAWEI TECHNOLOGIES CO., LTD.
- Current Assignee: HUAWEI TECHNOLOGIES CO., LTD.
- Current Assignee Address: CN Shenzhen
- Agency: Conley Rose, P.C.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@696d3499
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/10 ; G11C29/42 ; G11C11/56 ; G06F3/06 ; G11C16/26 ; G11C16/34 ; G11C29/52 ; H03M13/25

Abstract:
A flash memory error correction method and apparatus is provided. The method includes determining a first data bit in a flash memory page, where the first data bit corresponds to different data respectively in the data obtained by reading the flash memory page using the (n+1)th read voltage threshold and the data obtained by reading the flash memory page using the mth read voltage threshold; and then reducing a confidence level of the first data bit in the data obtained by reading the flash memory page using the (n+1)th read voltage threshold; and performing, according to an adjusted confidence level of the first data bit, error correction decoding on the data obtained by reading the flash memory page using the (n+1)th read voltage threshold. Present disclosure effectively improves a success rate of error correction decoding, thereby significantly improving performance of an SSD storage system.
Public/Granted literature
- US20180246782A1 Flash Memory Error Correction Method and Apparatus Public/Granted day:2018-08-30
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