Invention Grant
- Patent Title: Cross section processing observation method and charged particle beam apparatus
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Application No.: US16195155Application Date: 2018-11-19
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Publication No.: US10692695B2Publication Date: 2020-06-23
- Inventor: Xin Man
- Applicant: HITACHI HIGH-TECH SCIENCE CORPORATION
- Applicant Address: JP Tokyo
- Assignee: HITACHI HIGH-TECH SCIENCE CORPORATION
- Current Assignee: HITACHI HIGH-TECH SCIENCE CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Holland & Hart LLP
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@3b340c10
- Main IPC: H01J37/30
- IPC: H01J37/30 ; H01J37/20 ; H01J37/244 ; H01J37/22 ; H01J37/26 ; H01L21/66

Abstract:
Provided is a cross-section processing observation method capable of easily and accurately forming a cross-section used to observe a sample's inside, and a cross-section processing observation apparatus for cross-section processing. The method includes a design data acquisition step acquiring design data of a three-dimensional structure of a sample having three-dimensional structure, a moving step moving the sample based on coordinate information of the design data, a surface observation step acquiring an observation image of a surface of the sample, a cross-section forming step irradiating the sample's surface with an ion beam to form a cross-section of the three-dimensional structure, a cross-section observation step acquiring an observation image of the sample's cross-section, and a display step displaying image data, among pieces of the design data, of surface and cross section corresponding to respective locations of the surface and the cross section.
Public/Granted literature
- US20190164722A1 CROSS SECTION PROCESSING OBSERVATION METHOD AND CHARGED PARTICLE BEAM APPARATUS Public/Granted day:2019-05-30
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