Invention Grant
- Patent Title: Measurement system and temperature and/or shape change sensor using brillouin scattering analysis
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Application No.: US15762355Application Date: 2016-09-21
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Publication No.: US10697807B2Publication Date: 2020-06-30
- Inventor: Aghiad Khadour , Jean-Louis Oudar
- Applicant: INSTITUT FRANCAIS DES SCIENCES ET TECHNOLOGIES DES TRANSPORTS, DE L'AMENAGEMENT ET DES RESEAUX , CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE
- Applicant Address: FR Champs sur Marne FR Paris
- Assignee: INSTITUT FRANCAIS DES SCIENCES ET TECHNOLOGIES DES TRANSPORTS, DE L'AMENAGEMENT ET DES RESEAUX,CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE
- Current Assignee: INSTITUT FRANCAIS DES SCIENCES ET TECHNOLOGIES DES TRANSPORTS, DE L'AMENAGEMENT ET DES RESEAUX,CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE
- Current Assignee Address: FR Champs sur Marne FR Paris
- Agency: Hamre, Schumann, Mueller & Larson, P.C.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@28ff38bc
- International Application: PCT/FR2016/052393 WO 20160921
- International Announcement: WO2017/051119 WO 20170330
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01D5/353 ; G01K11/32 ; G01L1/24 ; H01S5/14 ; H01S5/10 ; H01S5/183 ; H01S3/08 ; H01S5/04

Abstract:
A measurement system for performing measurement by Brillouin scattering analysis, the system comprising a laser emitter device (10) configured to emit an incident wave (ν0) and a reference wave (ν0−νB), the incident wave presenting an incident frequency (ν0) and the reference wave presenting a reference frequency (ν0−νB), the reference frequency (ν0−νB) being shifted from the incident frequency (ν0) by a predetermined value (νB). The system is configured to: project the incident wave (ν0) into the optical fiber (25); receive in return a backscattered wave (ν0−νS); generate a composite wave (ν0-S, 0-B) combining the backscattered wave (ν0−νS) and the reference wave (S0−νB); and determine at least one property relating to the fiber by analyzing a Brillouin spectrum of the composite wave (ν0-S, 0-B). Advantageously, the incident wave and the reference wave come from a dual-frequency vertical-cavity surface-emitting laser source (12) forming part of the laser emitter device.
Public/Granted literature
- US20190072417A1 MEASUREMENT SYSTEM AND TEMPERATURE AND/OR SHAPE CHANGE SENSOR USING BRILLOUIN BACK-REFLECTION ANALYSIS Public/Granted day:2019-03-07
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