Invention Grant
- Patent Title: Measurement device and material tester
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Application No.: US16061837Application Date: 2016-02-24
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Publication No.: US10697872B2Publication Date: 2020-06-30
- Inventor: Hiroshi Tsuji
- Applicant: Shimadzu Corporation
- Applicant Address: JP Kyoto
- Assignee: Shimadzu Corporation
- Current Assignee: Shimadzu Corporation
- Current Assignee Address: JP Kyoto
- Agency: Maier & Maier, PLLC
- International Application: PCT/JP2016/055472 WO 20160224
- International Announcement: WO2017/145295 WO 20170831
- Main IPC: G01N3/00
- IPC: G01N3/00 ; G01N3/08 ; G01N3/06 ; G01N3/62 ; H03F3/45 ; G01B7/16

Abstract:
Once a sensor amplifier side connector of a cable unit for interconnecting a detector and a sensor amplifier is connected to the sensor amplifier, a gain resistor on the cable unit side and an instrumentation amplifier of the sensor amplifier are interconnected and the gain of the instrumentation amplifier is determined. As a result, the gain of the instrumentation amplifier is determined such that the magnitude of a signal that the sensor amplifier receives from the detector becomes a magnitude optimal for an analog circuit in the sensor amplifier.
Public/Granted literature
- US20180372602A1 MEASUREMENT DEVICE AND MATERIAL TESTER Public/Granted day:2018-12-27
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