Invention Grant
- Patent Title: Method and system for measuring a sensor
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Application No.: US15764954Application Date: 2016-10-07
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Publication No.: US10697896B2Publication Date: 2020-06-30
- Inventor: Bart Michiel de Boer , Paul Louis Maria Joseph van Neer , Peter Johan Harmsma
- Applicant: Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Applicant Address: NL 's-Gravenhage
- Assignee: Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Current Assignee: Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Current Assignee Address: NL 's-Gravenhage
- Agency: Leydig, Voit & Mayer, Ltd.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@66abbcb
- International Application: PCT/NL2016/050695 WO 20161007
- International Announcement: WO2017/061868 WO 20170413
- Main IPC: G01N21/77
- IPC: G01N21/77 ; G02B6/12

Abstract:
The present disclosure concerns a method and apparatus for measuring a sensor (10) comprising multiple optical resonators (11, 12) optically connected to a single optical output interface (16). The optical resonators (11, 12) are interrogated with a light input signal (Si). A light output signal (So) is measured from the optic al output interface (16) to determine a combined spectral response (Sa) covering a wavelength range (W) including a plurality of resonance peaks (λ1,i, λ2,j) for each of the optical resonators (11, 12). A Fourier transform spectrum (FT) of the combined spectral response (Sa) is calculated and a harmonic series of periodic peaks (n·f1) is identified in the Fourier transform spectrum (FT). The harmonic series of periodic peaks is filtered to obtain a filtered Fourier transform spectrum (FT1) and a sensor signal is calculated (X1) based on the filtered Fourier transform spectrum (FT1).
Public/Granted literature
- US20180266964A1 METHOD AND SYSTEM FOR MEASURING A SENSOR Public/Granted day:2018-09-20
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