Invention Grant
- Patent Title: Inspection system, inspection device, and inspecting method
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Application No.: US16325505Application Date: 2017-11-13
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Publication No.: US10697897B2Publication Date: 2020-06-30
- Inventor: Hirofumi Ienaga , Keisuke Maruko
- Applicant: MITSUBISHI HEAVY INDUSTRIES, LTD.
- Applicant Address: JP Tokyo
- Assignee: MITSUBISHI HEAVY INDUSTRIES, LTD.
- Current Assignee: MITSUBISHI HEAVY INDUSTRIES, LTD.
- Current Assignee Address: JP Tokyo
- Agency: Kanesaka Berner and Partners LLP
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@1554ed80
- International Application: PCT/JP2017/040782 WO 20171113
- International Announcement: WO2018/092726 WO 20180524
- Main IPC: G01N21/95
- IPC: G01N21/95 ; G01N21/88 ; G01N29/04 ; G01N21/954 ; G01N21/84

Abstract:
An inspection system for inspecting a composite material member formed of a composite material has a main body part; an ultrasonic probe connected with the main body part and configured to contact the main surface; an optical sensor part connected to the main body part to be movable in a first direction; and a processor. The ultrasonic probe is configured to input ultrasonic wave to the main surface of the composite material member and to receive reflection wave generated from the ultrasonic wave reflected by the composite material member. The optical sensor part is configured to emit sensor light in a second direction orthogonal to the first direction, and to receive reflection light generated from the sensor light reflected on the intersection surface. The processor is configured to output a measurement result based on the reflection wave and the reflection light.
Public/Granted literature
- US20190170658A1 INSPECTION SYSTEM, INSPECTION DEVICE, AND INSPECTING METHOD Public/Granted day:2019-06-06
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