Systems and methods are provided for blended analog-to-digital conversion for digital test and measurement devices. A first-frequency-domain circuit path is configured to generate a first processed digital signal having high fidelity to an analog signal over a first frequency domain. A second-frequency-domain circuit path is configured to generate a second processed digital signal having high fidelity to the analog signal over a second frequency domain. A blended digital signal is generated using the first processed digital signal and the second processed digital signal. The blended digital signal can have high fidelity to the analog signal over multiple frequency domains.