Invention Grant
- Patent Title: Camera and specimen alignment to facilitate large area imaging in microscopy
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Application No.: US16023219Application Date: 2018-06-29
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Publication No.: US10698191B2Publication Date: 2020-06-30
- Inventor: Matthew C. Putman , John B. Putman , Brandon Scott , Dylan Fashbaugh
- Applicant: Nanotronics Imaging, Inc.
- Applicant Address: US OH Cuyahoga Falls
- Assignee: NANOTRONICS IMAGING, INC.
- Current Assignee: NANOTRONICS IMAGING, INC.
- Current Assignee Address: US OH Cuyahoga Falls
- Agency: Renner Kenner Greive Bobak Taylor Weber
- Main IPC: G02B21/00
- IPC: G02B21/00 ; G02B21/36 ; G06K9/00 ; H04N1/387 ; G02B21/26 ; G06K9/20

Abstract:
A microscope system and method allow for a desired x′-direction scanning along a specimen to be angularly offset from an x-direction of the XY translation stage, and rotates an image sensor associated with the microscope to place the pixel rows of the image sensor substantially parallel to the desired x′-direction. The angle of offset of the x′-direction relative to the x-direction is determined and the XY translation stage is employed to move the specimen relative to the image sensor to different positions along the desired x′-direction without a substantial shift of the image sensor relative to the specimen in a y′-direction, the y′-direction being orthogonal to the x′ direction of the specimen. The movement is based on the angle of offset.
Public/Granted literature
- US20180335614A1 CAMERA AND SPECIMEN ALIGNMENT TO FACILITATE LARGE AREA IMAGING IN MICROSCOPY Public/Granted day:2018-11-22
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