Invention Grant
- Patent Title: System and method for control and/or analytics of an industrial process
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Application No.: US15172340Application Date: 2016-06-03
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Publication No.: US10698387B2Publication Date: 2020-06-30
- Inventor: Amit Verma
- Applicant: SIEMENS AKTIENGESELLSCHAFT
- Applicant Address: DE München
- Assignee: SIEMENS AKTIENGESELLSCHAFT
- Current Assignee: SIEMENS AKTIENGESELLSCHAFT
- Current Assignee Address: DE München
- Agency: Henry M. Feiereisen LLC
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@712d518f
- Main IPC: G05B19/418
- IPC: G05B19/418 ; G06F9/50 ; H04L12/00 ; G05B19/05 ; H04L12/64

Abstract:
A system for control and/or analytics of an industrial process, includes at least one plant-side automation unit, and at least one external processing unit. The automation unit receives process input variables, determines results of a first process control algorithm based on the process input variables within a defined period of time and sends the process input variables to the processing unit. The processing unit executes a second process control algorithm on the basis of the process input variables and the local automation unit receives the results of the second process control algorithm. The plant-side automation unit checks whether the results of the second process control algorithm were received within a time less than or equal to the defined time period. The plant-side automation unit applies the results of the second process control algorithm to the process, when the results were received within a time less than or equal to the defined time period.
Public/Granted literature
- US20160357175A1 SYSTEM AND METHOD FOR CONTROL AND/OR ANALYTICS OF AN INDUSTRIAL PROCESS Public/Granted day:2016-12-08
Information query
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