Invention Grant
- Patent Title: Inspection device and inspection method
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Application No.: US16371367Application Date: 2019-04-01
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Publication No.: US10698531B2Publication Date: 2020-06-30
- Inventor: Noriyuki Hoshiai , Shinichi Miyazaki
- Applicant: Sharp Kabushiki Kaisha
- Applicant Address: JP Sakai
- Assignee: SHARP KABUSHIKI KAISHA
- Current Assignee: SHARP KABUSHIKI KAISHA
- Current Assignee Address: JP Sakai
- Agency: Keating & Bennett, LLP
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@7a8b24a6
- Main IPC: G01R27/26
- IPC: G01R27/26 ; G06F3/041 ; G06F3/044 ; G01R17/02 ; G01R17/00

Abstract:
An embodiment of the present invention makes it possible to carry out stable inspection on performance of a touch panel. An inspection device for inspecting a touch panel on a basis of a resistance value of a transparent film of the touch panel, which includes at least the transparent film, a dielectric member, and a sensor stacked on top of each other, includes: an integrating circuit configured to obtain a background capacitance of the touch panel by applying a first pulsed voltage to the sensor; and a switch configured to connect the transparent film to a ground or to a generator configured to generate a second pulsed voltage which is opposite in phase to the first pulsed voltage.
Public/Granted literature
- US20190302958A1 INSPECTION DEVICE AND INSPECTION METHOD Public/Granted day:2019-10-03
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