Invention Grant
- Patent Title: Method and apparatus for image adjustment for panoramic image stitching
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Application No.: US15432421Application Date: 2017-02-14
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Publication No.: US10699375B2Publication Date: 2020-06-30
- Inventor: Muninder Veldandi , Prasad Balasubramanian
- Applicant: Nokia Technologies Oy
- Applicant Address: FI Espoo
- Assignee: Nokia Technologies Oy
- Current Assignee: Nokia Technologies Oy
- Current Assignee Address: FI Espoo
- Agency: Alston & Bird LLP
- Main IPC: G06T11/60
- IPC: G06T11/60 ; G06T3/40 ; H04N5/232 ; H04N13/207 ; H04N13/00

Abstract:
A method, apparatus and computer program products are provided for reducing artifacts in a seam region when stitching overlapping images. One example method includes extracting the seam region from the overlapping images, wherein the overlapping images comprise a first image captured by a first image capturing device and a second image captured by a second image capturing device, the overlapping images sharing the seam region, the seam region being a region of each of the first image and the second images depicting a common captured area, applying a set of convergence values to the seam region generating a plurality of strips corresponding to the seam region, dividing the plurality of strips into multiple vertical segments, and computing an optimal convergence for each of the multiple vertical segments.
Public/Granted literature
- US20180232854A1 METHOD AND APPARATUS FOR IMAGE ADJUSTMENT FOR PANORAMIC IMAGE STITCHING Public/Granted day:2018-08-16
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