A method of training artificial intelligence to estimate sensing voltages for a storage device is provided, which includes steps of: supplying initial sensing voltages to memory units; defining various storing states; comparing threshold voltages of the memory units with the initial sensing voltages to classify the memory units; calculating a ratio of the number of the memory units in a strong correct region to the number of in the strong correct region and a weak correct region; calculating a ratio of the number of the memory units in a strong error region to the number of in the strong error region and a weak error region; calculating the number of the memory units in the weak correct and error regions to obtain a histogram parameter; inputting the ratios and parameter to an artificial intelligence neural network; and using machine learning to analyze practical sensing voltages.