Invention Grant
- Patent Title: Semiconductor device and method for fabricating a semiconductor device
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Application No.: US16164574Application Date: 2018-10-18
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Publication No.: US10700172B2Publication Date: 2020-06-30
- Inventor: Michael Hutzler , Franz Hirler , Ralf Siemieniec
- Applicant: Infineon Technologies Austria AG
- Applicant Address: AT Villach
- Assignee: Infineon Technologies Austria AG
- Current Assignee: Infineon Technologies Austria AG
- Current Assignee Address: AT Villach
- Agency: Murphy, Bilak & Homiller, PLLC
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@73e79317
- Main IPC: H01L29/40
- IPC: H01L29/40 ; H01L29/06 ; H01L29/417 ; H01L29/423 ; H01L29/66 ; H01L29/78 ; H01L29/10

Abstract:
In an embodiment, a semiconductor device is provided that includes a semiconductor body having a first conductivity type, a first major surface and a second major surface opposite the first major surface, a gate arranged on the first major surface, a body region having a second conductivity type opposite the first conductivity type, the body region extending into the semiconductor body from the first major surface, a source region having the first conductivity type, the source region being arranged in the body region, a buried channel shielding region having the second conductivity type, a contact region having the second conductivity type, and a field plate arranged in a trench extending into the semiconductor body from the first major surface.
Public/Granted literature
- US20190123153A1 Semiconductor Device and Method for Fabricating a Semiconductor Device Public/Granted day:2019-04-25
Information query
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