Invention Grant
- Patent Title: Shape measuring device and shape measuring method
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Application No.: US16355884Application Date: 2019-03-18
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Publication No.: US10704899B2Publication Date: 2020-07-07
- Inventor: Shinya Takahashi
- Applicant: Keyence Corporation
- Applicant Address: JP Osaka
- Assignee: KEYENCE CORPORATION
- Current Assignee: KEYENCE CORPORATION
- Current Assignee Address: JP Osaka
- Agency: Kilyk & Bowersox, P.L.L.C.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@25700067 com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@4fa9532
- Main IPC: G01B11/25
- IPC: G01B11/25 ; G06T7/529

Abstract:
A shape measuring device includes a stereoscopic-shape-data generating section 212 configured to generate stereoscopic shape data indicating a shape of the measurement object with a pattern projection method, a measurement-setting automatically adjusting section 217 configured to automatically adjust measurement setting for the partial regions on the basis of at least one of stereoscopic shape data of the partial regions and light reception data acquired in the partial regions when the stereoscopic shape data is generated, and a stereoscopic-shape-data coupling section 219 configured to couple, according to the measurement setting for the partial regions adjusted by a measurement setting adjusting section, the stereoscopic shape data of the partial regions generated again by the stereoscopic-shape-data generating section 212 and generate coupled stereoscopic shape data corresponding to the coupled region.
Public/Granted literature
- US20190323830A1 Shape Measuring Device And Shape Measuring Method Public/Granted day:2019-10-24
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